⚡ 📶 Convenience functions for lumped device/junction capacitance/conductivity RC(f) extraction

[daquinteroflex]

Hello! Just another idea that popped in the other day, I haven't found/seen (yet) if we have this functionality already.

Sometimes, say, people designing microwave or electrostatic opto-electronic devices model their electronic performance by making analytical capacitance/resistance/inductance models of the device junctions. Say, if I wanted to model how a PIN junction would change the capacitance over a given resonance frequency. I'm pretty sure that data can be extracted from the permittivity data, conductivity info, but it might be useful for people implementing these lumped models in say SPICE, HFSS, CST etc. to be able to say easily extract the relevant parameters at a given frequency/power.